CSPM5500 Multifunction scanning probe microscope --Full-featured, next generation scanning probe microscope (SPM) "National Major Scientific Instrument and Equipment Development Project" Achievement Transformation Product Features include: Atomic Force Microscope (AFM), Lateral Force Microscope (LFM), Scanning Tunneling Microscope (STM), Curve Measurement and Analysis, Nanofabrication, Magnetic/Electrostatic Force Microscope, Environmental Control Scanning Probe Microscope, Liquid Phase Scanning Probe Microscope, Conducting Atomic Force Microscope, Scanning Probe Acoustic Microscope, Scanning Kelvin Probe Microscope, Piezoelectric Force Microscope, Force Modulation Mode, Scanning Capacitance Microscope, Scanning Thermal Microscope, etc. Cover the atmosphere, liquid phase, controlled atmosphere and high and low temperature and other working environment and detection conditions; Built-in temperature and humidity sensor, real-time monitoring of "probe-sample" system temperature and humidity; The probe is sealed with a large aperture top-view quartz window and a built-in adjustable brightness lighting system. High precision metrology instrument with patented scanning technology and calibration with PTB traceable standards.

CSPM8000 Industrial size sample scanning probe microscope Break through the foreign technology blockade and solve the "cutthroat" problem of nano-characterization card The lightweight design of the detector has high structural rigidity and natural frequency, which effectively improves the stability of the scanning probe assembly. The probe is designed symmetrically, and the tip of the probe is fixed at the midpoint of the supporting beam, which can effectively restrain the thermal drift caused by the fluctuation of ambient temperature.

CSPM5500P Precision positioning scanning probe microscope Ultra-high resolution assisted optical microscopy positioning, real-time observation of samples, accurate positioning of probe scanning area One-scan technology, 4096×4096 image resolution; 10um level scanning can get the sample nm level details

CSPM5500B Biological scanning probe microscope Used with inverted fluorescence microscope (suitable for mainstream models such as Leica, Zeiss, Olympus, etc.; special customization is supported) The system functions include AFM, LFM, nano-machining and so on. It has a variety of nano-mechanical measurement and analysis functions Closed-loop piezoelectric scanning stage with built-in capacitance sensor, automatic correction of nonlinearity and orthogonality of scanning

BY series scanning probe microscope --Cost-effective scanning probe microscope/atomic force microscope/scanning tunneling microscope Includes three models: BY1000 Scanning Tunneling Microscope (STM) BY2000 Atomic Force Microscope (AFM)